Manufacturing and Industrial Analysis
- OCR on Industrial Sites
- Welding Defect Analysis with Computer Vision
Corresponding Youtube Links:
- Vision-based Quality Analysis
- Defect Analysis on Product Pathway
- Virtual Metrology on Critical Dimension of Display
- Defect Analysis with Human Annotation and Active Learning
- Wafer Defect Clustering and Analysis
Publication Citation: Lee, J. H., Moon, I. C., & Oh, R. (2021). Similarity Search on Wafer Bin Map Through Nonparametric and Hierarchical Clustering. IEEE Transactions on Semiconductor Manufacturing, 34(4), 464–474
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